NEW SENresearch 4.0 Workshop in Warsaw, Poland
Our Polish distributor LABSOFT will organize a seminar and workshop on the new spectroscopic ellispometer SENresearch 4.0.
Apple–s Printed Battery Acquisition Likely to Disappoint
Other Printed Electronics Acquisition by BASF and Merck Also Miss the Mark, While Xerox–s Deal Represents a Best-in-Breed Transaction, According to Lux Research Analysis
SENTECH Seminar on Ellipsometry and Reflectometry 2015
A one day seminar on the topic “Ellipsometry and Reflectometry for the characterization of thin films” was organized by SENTECH in Stuttgart, June 18, 2015. The seminar was focussed on innovations of SENTECH metrology as well as on new developments in science and technology. Invited speakers and SENTECH experts addressed topics from in situ process control, over nanotechnology to photovoltaics.
NEW! 10 times faster spectroscopic ellipsometer
The SENresearch family represents the high end of SENTECH spectroscopic ellipsometers and includes the unique combination of FTIR (Fourier Transform Infrared) spectroscopy and multiplex diode array spectrometry for spectroscopic ellipsometry
SENTECH presents new ALD Real Time Monitor at SEMICON Europa
With more than 6000 visitors the SEMICON Europa 2014 was the ideal place to introduce SENTECH’s latest development on the field of atomic layer deposition (ALD) – the new ALD Real Time Monitor.
Application-oriented thin film measurement seminar
SENTECH as a worldwide leader in thin film measurement and plasma process technology organizes application oriented seminars on a regular basis. The most recent seminar “Ellipsometry and Reflectometry for characterizing thin films” was on thin film measurement.