Cray selects ASSET’s ScanWorks platform for embedded diagnostics in next-generation supercomputers

By Publisher on August 26, 2009   Electronics & Semiconductors  

Richardson, TX / Munich (August 19, 2009) – Supercomputer leader Cray Inc. has selected ASSET® InterTech’s ScanWorks® platform for embedded instrumentation as the basis for embedded test solutions critical to Cray’s next-generation supercomputers. ASSET (www.asset-intertech.com) is the leading supplier of open tools for embedded instrumentation for design validation, test and debug. Cray will collaborate with ASSET and ASSET will deliver embedded test logic intellectual property (IP) tha