Advantest Introduces New T2000 3Gbps CMOS Image Capture Module for Industry-Leading T2000 ISS Semiconductor Test Platform
High-Speed Image Capturing and Highly Parallel Testing Help to Reduce Production Costs for CMOS Image Sensing Devices
Advantest Introduces T2000 8Gbps Digital Module for High-Speed Testing of SoCs With Serial, Parallel or Memory Interfaces
Versatile New Test Instrument Reduces Costs and Speeds Time to Market for New ICs
Advantest Introduces T2000 IMS for Low-Cost Testing of Integrated Microcontroller and Smart Card ICs
Company-s Universal Pin Architecture Enables Massively Parallel Testing in a Single System
Semiconductor Test Equipment Leader Advantest Completes Move of U.S. Headquarters to San Jose, Calif.
Consolidates Silicon Valley Operations Into a Single Facility Designed for Increased Efficiency and Low Environmental Impact
Advantest to Showcase Comprehensive Line-up of SOC and Memory Platforms at SEMICON West 2012
Booth to Feature Complete Portfolio of Testers, Probe Cards and Handlers
Advantest Introduces Industry-s Highest Capability 3-in-1 Semiconductor Test Clock Module to Improve Yields and Save Time & Money in Testing High-Speed ICs
Module-s Ability to Test All Variations of Clock Requirements Enables Greater Test Coverage in a Single System
Verigy, an Advantest Group Company, to Feature Keynote Address by Forward Thinker, Mitch Ditkoff, at VOICE 2012 User-s Group and Partner-s Conference
CUPERTINO, CA — (Marketwire) — 01/19/12 — Semiconductor test equipment supplier Verigy, an Advantest Group company (TSE: 6857) (NYSE: ATE), will feature a keynote presentation at VOICE 2012 by Mitch Ditkoff, an author, blogger and management consultant. A frequent keynote and large group workshop facilitator, Ditkoff has been an adjunct faculty member for several esteemed leadership development programs, including GE-s Crotonville Management Development Center and Duke Corporate Education.