NEW SENresearch 4.0 Workshop in Warsaw, Poland
Our Polish distributor LABSOFT will organize a seminar and workshop on the new spectroscopic ellispometer SENresearch 4.0.
SENTECH Seminar on Ellipsometry and Reflectometry 2015
A one day seminar on the topic “Ellipsometry and Reflectometry for the characterization of thin films” was organized by SENTECH in Stuttgart, June 18, 2015. The seminar was focussed on innovations of SENTECH metrology as well as on new developments in science and technology. Invited speakers and SENTECH experts addressed topics from in situ process control, over nanotechnology to photovoltaics.