UnitySC Expands; Opens U.S. Office With Global Software Development Center and Customer Demo Lab

New Facility Enhances Company–s Semiconductor Process Control Capabilities and Supports Growing North America Customer Base
New Facility Enhances Company–s Semiconductor Process Control Capabilities and Supports Growing North America Customer Base
Leading IDM Selects New 4See Series Automated Defect Inspection Platform for Power Semiconductor Automotive Applications
Our Polish distributor LABSOFT will organize a seminar and workshop on the new spectroscopic ellispometer SENresearch 4.0.
A one day seminar on the topic “Ellipsometry and Reflectometry for the characterization of thin films” was organized by SENTECH in Stuttgart, June 18, 2015. The seminar was focussed on innovations of SENTECH metrology as well as on new developments in science and technology. Invited speakers and SENTECH experts addressed topics from in situ process control, over nanotechnology to photovoltaics.
The SENresearch family represents the high end of SENTECH spectroscopic ellipsometers and includes the unique combination of FTIR (Fourier Transform Infrared) spectroscopy and multiplex diode array spectrometry for spectroscopic ellipsometry
Tool Frees Up Valuable Fab Floor Space for Production Equipment; Allows for Internal Expansion of Manufacturing Capacity
SENTECH as a worldwide leader in thin film measurement and plasma process technology organizes application oriented seminars on a regular basis. The most recent seminar “Ellipsometry and Reflectometry for characterizing thin films” was on thin film measurement.
Company Enters New Market With Laser Product Slated for High-Precision Metrology Systems