Advantest Introduces Production Model of Its EVA100 Measurement System for Sensors, Analog and Mixed-Signal ICs
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New EVA100 Production Model Offers Versatile, Easy-to-Use Test Solution for Applications From Design Evaluation to Volume Production
New EVA100 Production Model Offers Versatile, Easy-to-Use Test Solution for Applications From Design Evaluation to Volume Production
Tenth Annual International Test Conference to Be Held in Both the U.S. and Taiwan, Featuring Technical Sessions and Networking Opportunities
Global Test Leader Displaying the Latest Semiconductor Test and Measurement and Nanotechnology Solutions
SAN JOSE, CA — (Marketwired) — 09/30/15 — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) will demonstrate both hardware and online test solutions as well as present several papers at the International Test Conference (ITC), October 6-8 in Anaheim, Calif. Advantest is a Platinum sponsor of this year–s conference.Live demonstrations of Advantest–s on-demand and its for analog, mixed-signal and sensor ICs will be given in booth #323 in the South
Region–s Semiconductor Test Engineers to Train and Develop Professional Skills on Advantest–s Industry-leading Test Solutions
Sidense to Discuss Ultra Low Power OTP Design for the Smart Connected Universe
New HSM16G Card Designed for Fully Integrated Testing of the Current and Upcoming Generation of DRAM Memory ICs With Data Rates up to 16 Gbps
Advantest–s MPT3000 System With Comprehensive Multi-Protocol Capability Enables USI to Create New OSAT Business Dedicated to SSD Testing
Company–s Test Solutions for All Types of Memory ICs Enable Cost-Efficient Chip Production for IoT, Wearable Electronics and More
Booth Exhibits and Paper Presentation Address SSD Testing From Engineering to Volume-Production Environments