SENTECH offers an application oriented seminar on the topic “Plasma-Process-Technology” on March 9, 2017 at SENTECH in Berlin Adlershof. We are glad to announce that invited speakers from industry and science will give presentations on plasma etching, PECVD and PEALD and share their experiences with different applications.
SENTECH proudly presents the new spectroscopic ellipsometer SENresearch 4.0.
The SENresearch 4.0 is an innovative ellipsometry solution which features widest spectral ranges and highest spectral resolution. The Step Scan Analyser (SSA) principle is applied for ellipsometric measurement, i.e. there are no moving optical parts during data acquisition for best measurement results.
