New Spectroscopic Ellipsometer SENresearch 4.0 launched!

New Spectroscopic Ellipsometer SENresearch 4.0 launched!

SENTECH proudly presents the new spectroscopic ellipsometer SENresearch 4.0.
The SENresearch 4.0 is an innovative ellipsometry solution which features widest spectral ranges and highest spectral resolution. The Step Scan Analyser (SSA) principle is applied for ellipsometric measurement, i.e. there are no moving optical parts during data acquisition for best measurement results.

SENTECH Seminar on Plasma Process Technology 2015

SENTECH has organized a seminar on Plasma Process Technology on March 5th 2015, held at SENTECH Instruments in Berlin Adlershof. The Seminar was the 10th plasma seminar and attracted more than 50 specialists from industry, research institutions and universities. Aim of the seminar was to bring various user groups from industry and R&D together for networking. Taking the opportunity SENTECH introduced the new ALD Real Time Monitor.