Advantest Announces Newest Handler for Testing Advanced Memory ICs
New M6245 Handler Offers Greater Positioning Accuracy, Throughput and Temperature Control for Higher Test Yields
Advantest Introduces Newest Parametric Measurement Module to Extend SoC Testing Capabilities of T2000 Platform
New PMU32E Module Doubles the Resolution and Accuracy of Its Predecessor
Advantest to Exhibit at SEMIsrael 2014 in Airport City, Israel on November 25
Showcasing Market Leading ATE Solutions and Presenting a Technical Paper
MEDIA ALERT: Advantest to Exhibit at Electronica 2014 in Munich, Germany November 11-14
Debuting the EVA100 Measurement System for Testing Analog, Mixed-Signal and Sensor ICs
Advantest Introduces Leading-Edge Tester for Display Driver Semiconductors Used in High-Resolution LCD Panels
New T6391 Test System Improves Throughput and Capabilities Compared to Previous Models
Advantest Opens VOICE 2015 Call for Papers
Advantest Developer Conference Expands to Shanghai, China in May 2015
Media Alert: Advantest to Exhibit at SEMICON Europa 2014 in Grenoble, France October 7-9
Showcasing Solutions for E-Beam Lithography and CD-SEM Metrology, as Well as New Non-Destructive Terahertz Imaging Systems
Advantest Introduces High-Performance Test Handler for SoC Devices, Offering Industry-Leading Productivity and Flexibility
New M4871 Combines Production-Proven Capabilities of Company-s Existing Handlers With Functions Needed for Testing Advanced SoCs
Advantest Introduces New Image-Processing Unit for Testing Advanced CMOS Image Sensors on Industry-Leading T2000 Platform
New T2000 ISS IPE2 Unit Uses Greater Image-Processing Power to Achieve Higher Throughput and Lower Cost of Test
Advantest Announces New 64-Channel, General Purpose VI Module on T2000 Platform for Low-Cost Testing of High-Density, Multi-Function Power Management, Automotive ICs
New T2000 GVI64 Module Performs Highly Parallel Testing of ICs for Power-Management and Automotive Applications