NVIDIA Installs First Meridian(TM) WS-DP for Full Wafer Electrical Fault Analysis Under Production Conditions
New Optical Based Tool From DCG Systems(R) Reduces Time to Isolate Electrical Faults From Weeks to Days on Advanced Process Nodes
DCG Systems Ranked Among Fastest Growing Companies in North America on Deloitte-s 2013 Technology Fast 500(TM)
Attributes 349.3 Percent Revenue Growth to Innovative Products That Support Fast Yield Ramp of Advanced Semiconductors Devices
DCG Systems Deepens Management Team
FREMONT, CA — (Marketwired) — 11/06/13 — Today DCG Systems, Inc., the leading supplier of electrical fault characterization, localization and editing equipment, announced the appointment of Ron Williamson as Vice President, Worldwide Sales and Becky Howland, Ph.D. as Vice President, Technical Marketing. Tam Anayama, the previous Vice President of Sales, will assume the newly created position of Vice President, Business Development. These changes will allow DCG Systems to strengthen its prese
DCG Systems Announces nProber II(TM)
Proven Nanoprobing Solution for the 14nm Node and Beyond
DCG Systems Appoints Ronen Benzion to President
FREMONT, CA — (Marketwire) — 03/19/13 — DCG Systems, Inc. today announced that it has appointed Ronen Benzion to President of DCG Systems. Ronen will assume the position of President for Dr. Israel Niv, who will continue to serve as Chief Executive Officer. In their respective roles, Mr. Benzion will be expanding products into Inspection and Metrology along with continuing to lead the existing three Product Groups, Field Operations and US Manufacturing Operations, while Dr. Niv will focus on
DCG Systems and Checkpoint Technologies Settle Patent Infringement Lawsuit
Checkpoint to Pay Past Damages and Royalties on Future Sales
Top-Tier Memory Supplier Purchases ELITE(TM) System From DCG Systems for Advanced 3D-IC Development
Thermal Lock-In Analysis Accelerates Time-to-Market
Major Japanese Manufacturer Has Selected DCG-s ELITE for Inspection of Next Generation SiC Power Devices
FREMONT, CA and SHIN-YOKOHAMA, JAPAN — (Marketwire) — 11/11/12 — DCG Systems, Inc. the leading provider of semiconductor diagnostic, characterization and defect localization solutions, today announced that a major power device manufacturer purchased DCG-s ELITE System for inspection of their next generation SiC power devices."Sensitivity of the system is much better than we had expected and beyond even some of the claimed specifications provided by DCG," stated the Manager of the c
At ISTFA 2011, DCG Systems to Showcase Non-Destructive 3D Defect Localization
FREMONT, CA — (Marketwire) — 11/16/11 — DCG Systems, Inc. is exhibiting at the 37th annual International Symposium for Testing and Failure Analysis (ISTFA) November 15-16 at the San Jose Convention Center. They will be in booth #401 to engage ISTFA attendees with DCG-s extensive product portfolio and in particular will announce ELITE software optimized for the non-destructive 3D defect localization in packaged semiconductor devices. The ELITE has proven effective in identifying defects with
DCG Systems Introduces the Next Generation OptiFIB for Circuit Edit to the 22nm Node and Beyond
FREMONT, CA — (Marketwire) — 11/16/11 — DCG Systems, Inc. introduced today the OPTIFIB Viper, the next generation system for circuit edit. The OptiFIB IV has been the leader in circuit edit (CE) and is actively used by leading semiconductor companies to edit process technologies down to the 28nm node. The OptiFIB Viper incorporates a new coaxial photon-ion column to provide spot sizes 50% smaller than those of the OptiFIB-IV. Further, OptiFIB Viper operates seamlessly at lower beam energies