Cray selects ASSET’s ScanWorks platform for embedded diagnostics in next-generation supercomputers

By on    Electronics & Semiconductors  

Richardson, TX / Munich (August 19, 2009) – Supercomputer leader Cray Inc. has selected ASSET® InterTech’s ScanWorks® platform for embedded instrumentation as the basis for embedded test solutions critical to Cray’s next-generation supercomputers. ASSET (www.asset-intertech.com) is the leading supplier of open tools for embedded instrumentation for design validation, test and debug. Cray will collaborate with ASSET and ASSET will deliver embedded test logic intellectual property (IP) tha

Dehne, longtime National Instruments executive, joins ASSET’s Board of Directors

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Richardson, TX / Munich (June 17, 2009) – Tim Dehne, until recently a longtime executive with National Instruments, Inc. (NI), has joined the board of directors of ASSET® InterTech, Inc., the leading supplier of open tools for embedded instrumentation. Over a career stretching more than 21 years at NI, Mr. Dehne led global marketing, and research and development at the company that had $824 million in revenues in 2008.

ASSET’s ScanWorks for Embedded Boundary Scan offers in-system JTAG test and diagnostics

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Richardson, TX / Munich (February 3, 2009) – The new ScanWorks® for Embedded Boundary Scan from ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, can be easily embedded in high-availability systems where it can apply system-level JTAG (SJTAG) test, diagnostic and programming algorithms. Typically, the ScanWorks for Embedded Boundary Scan intellectual property (IP) will be embedded in systems where any ScanWorks functionality can

ASSET joins Synopsys in-Sync Program to Advance Embedded Instrumentation Tools

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Richardson, Texas/ Munich (October 28, 2008) – ASSET® (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has joined Synopsys’ in-Sync program for third-party suppliers of EDA-related products. Synopsys is a world leader in software and IP for semiconductor design and manufacturing. This step marks a significant advance towards ASSET’s commitment to deliver technology for embedded instrumentation tools.

ASSET brings JTAG test tools perspective to IEEE 1149.7

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Richardson, TX/Munich (September 11, 2008) – ASSET® InterTech (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, has assumed a principal role in the development of IEEE 1149.7 as one of the founding members of the working group that is defining the emerging standard, which will be ratified in early 2009.

Flexible licensing gives global access to ASSET’s MicroMaster JTAG functional test system

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Richardson, TX/Munich-Graefelfing (September 9, 2008) – With its new licensing arrangement, the capabilities of ASSET® InterTech’s MicroMaster e-JTAG CPU emulation functional test and debug system can be flexibly deployed by global enterprises so that engineers have access to the system’s capabilities anywhere and at any time. Moreover, MicroMaster can now be flexibly configured with the capabilities required at critical phases in a product’s life cycle, beginning with development, moving in

ASSET in leadership position as one of the founding members of iNEMI’s boundary scan initiative

By on    Electronics & Semiconductors  

Richardson/Munich, September 01, 2008 –ASSET® InterTech Inc. (www.asset-intertech.com), the leading supplier of open tools for embedded instrumentation, recently became a founding member of the International Electronics Manufacturing Initiative’s (iNEMI) boundary scan adoption project. iNEMI, which is an electronics industry consortium of over 70 manufacturers, suppliers and related organizations, has undertaken an effort to encourage greater adoption of the IEEE 1149.1 boundary scan standa