It will take place in May 11-12, 2016 at Labsoft headquarter, ul. Puławska 469, Warsaw.
Main topics of the exclusive event will be:
-New SENTECH spectroscopic ellipsometer SENresearch 4.0 – widest UV-VIS-NIR spectral range, large number of field upgradable accessories
-SpectraRay 4.0 – full featured software package for advanced material analysis
-Metrical, electrical and chemical information by FTIR ellipsometry up to 3500 nm wavelength
-Analysis of anisotropic samples by full Mueller matrix measurement
-Analysis of 2D periodic structures by scatterometry
-Complex sample analysis by variable angle, multi-experiment, and combined photometric ellipsometric measurements
If you want to participate on this event, you can register by sending an email to our Polish sales consultant Marta Izydorzak-Woźniak.
The participation is free of charge!
Samples to be measured can be brought on the second workshop day!
We are looking forward to see you in Warsaw!
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