BEAVERTON, OR — (Marketwired) — 03/29/16 — Cascade Microtech, Inc. (NASDAQ: CSCD), a leader at enabling precision measurements of integrated circuits at the wafer level, announces the Call for Papers for its fourth users– conference, COMPASS 2016. The conference will provide Cascade Microtech users with best practices, tools and techniques to increase productivity across wafer probing applications. The conference will address important issues in various use cases to include device characterization and modeling, reliability, and manufacturing test. The two-day conference begins with a welcome reception on October 16, 2016 leading into two days of workshops and presentations on October 17th and 18th at the Portland, Oregon Hilton Hotel, culminating with product demonstrations at Cascade Microtech–s Beaverton, Oregon headquarters.
“We have been both grateful and excited at the growing support of COMPASS from customers and industry leaders,” said Michael Burger, President and CEO. “Now in our fourth year, we have a team of customer volunteers on the steering and technical committees who are driving a rich conference agenda that will engage test managers, engineers, and innovators from around the world.”
COMPASS will give users the opportunity to share ideas and solutions with fellow attendees who utilize a wide spectrum of process technologies. Topics will focus on industry-wide challenges and emerging technology requirements. Attendees will learn about the newest probe solutions for device characterization and modeling, and solutions for enabling high-volume test, while networking with technical experts from Cascade Microtech as well as the company–s customers and partners.
Abstracts are being accepted through April 21, 2016 for 25-minute presentations for technology tracks covering a wide variety of both engineering and production topics including, but not limited to:
RF/mmW measurement and calibration methodology – technology trends and theory
High-voltage/high-current on-wafer device characterization
Sub-THz measurements up to 500 GHz and beyond
3D TSV RF characterization
Probe card metrology tools
40+ GHz test including automotive radar, cell phone short haul/backhaul, 802.11ad
Small pad probing — procedures, guidelines, solutions
DC parametric test
Optoelectronics test and measurement; silicon photonics
Over-temperature measurements — dealing with challenges, suggested guidelines and solutions
Tips, tricks and utilities for dealing with challenging probing situations
To see the full list of suggested topic areas, and view the formal Call for Papers, visit . To respond to the Call for Papers, send an email with your name, presentation title, and a 200-word abstract to .
Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech–s leading-edge stations, probes, probe cards and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit .
FOR MORE INFORMATION, CONTACT:
Laurie Winton
Cascade Microtech, Inc.
(503) 601-1934
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