TOKYO, JAPAN — (Marketwired) — 12/09/15 — Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) (NYSE: ATE) has announced a new RECT550EX HIFIX (High-Fidelity Test Access Fixture) unit to enhance the capabilities of its T2000 system-on-chip (SoC) test platform in performing highly parallel testing. The RECT550EX HIFIX has 50 percent more application space and is capable of handling 30 percent more channels than the previous RECT550 HIFIX model, enabling highly parallel and simultaneous measurements.
With market demand growing for price-sensitive ICs used in automotive, smart phone and other high-volume applications, conducting simultaneous measurements of multiple semiconductors has become vital to test cost reduction. Performing such highly parallel testing requires a performance board capable of handling the many circuit loads necessary for testing today–s most advanced analog devices.
The T2000 platform is capable of accommodating several high-density test modules in the test head. The RECT550EX HIFIX enables the T2000 to take full advantage of these modules by allowing the system to be configured as needed for any device under test including automotive semiconductors and power-management ICs. In addition, the new HIFIX unit maintains full compatibility with Advantest–s standard RECT550 HIFIX performance boards. When equipped with the RECT550EX HIFIX, the T2000 SoC tester can achieve an extremely low cost of test.
Shipments of the new RECT550EX HIFIX are scheduled to begin in December 2015.
A world-class technology company, Advantest is the leading producer of automatic test equipment (ATE) for the semiconductor industry and a premier manufacturer of measuring instruments used in the design and production of electronic instruments and systems. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also focuses on R&D for emerging markets that benefit from advancements in nanotech and terahertz technologies, and has introduced multi-vision metrology scanning electron microscopes essential to photomask manufacturing as well as groundbreaking 3D imaging and analysis tools. Founded in Tokyo in 1954, Advantest established its first subsidiary in 1982, in the USA, and now has subsidiaries worldwide. More information is available at .
Advantest Corporation
3061 Zanker Road
San Jose, CA 95134, USA
Judy Davies
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