BEAVERTON, OR — (Marketwired) — 06/25/15 — Cascade Microtech, Inc. (NASDAQ: CSCD), a leading supplier of solutions that enable precision measurements of integrated circuits at the wafer level, announced today that Thomas Neyer, Ph.D., Fellow, High Voltage Device and Technology Development, Fairchild Semiconductor, will deliver the keynote address at the company–s annual users– conference. COMPASS 2015 will be held on September 15-16, 2015 at the Omni Parker House in Boston, MA, beginning with a networking reception on the evening of September 14.
As this year–s keynote speaker, Neyer will share his insights on the future of power electronics and the impending challenges to metrology. Neyer joined Fairchild Semiconductor in 2011 as the vice president of research and development, and today heads Fairchild–s worldwide high-voltage research and development efforts. Neyer holds a Ph.D. from Vienna University of Technology and Cambridge University, and owns several patents in power device technology and test. High-voltage ( > 1 kV), high-current ( > 150 A) and extreme switching speeds can present considerable challenges, and Neyer will discuss trends for silicon and wide-bandgap power devices, and will reveal some of the issues the industry encounters when characterizing and testing these advanced power switches and passives.
Dr. James Lloyd, senior research scientist and professor at SUNY Polytechnic Institute CNSE, will kick off the second day of COMPASS sessions as the featured speaker, focusing on emerging reliability issues that arise as new materials and processes are implemented. Dr. Lloyd has a background in reliability science and engineering, having worked at IBM, T.J. Watson Research Center, Max Planck Institute for Metals Research, Jet Propulsion Laboratory, and Digital Equipment Corporation. A knowledgeable instructor on the subject of reliability, Lloyd will address its growing importance in today–s complex environment.
COMPASS 2015 offers a great lineup of speakers from industry leaders such as Fairchild, Freescale, imec, Keysight Technologies, Maury Microwave, Northrop Grumman, University of Massachusetts and more. They will be sharing their perspectives on meeting emerging test challenges with innovative ideas and best practices. COMPASS 2015 also provides excellent networking opportunities with test and measurement peers, as well as Cascade Microtech–s management and technical experts.
To learn more or to register for COMPASS 2015, visit .
Cascade Microtech, Inc. (NASDAQ: CSCD) is a worldwide leader in precision contact, electrical measurement and test of integrated circuits (ICs), optical devices and other small structures. For technology businesses and scientific institutions that need to evaluate small structures, Cascade Microtech delivers access to electrical data from wafers, ICs, IC packages, circuit boards and modules, MEMS, 3D TSV, LED devices and more. Cascade Microtech–s leading-edge stations, probes, probe cards, advanced thermal subsystems and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. For more information visit .
FOR MORE INFORMATION, CONTACT:
Laurie Winton
Cascade Microtech, Inc.
(503) 601-1934
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