AUSTIN, TX — (Marketwire) — 07/26/11 —
, Inc., a RF and wireless company, will attend , National Instruments 17th annual technology conference, and demonstrate a new platform for smartphone testing in National Instruments RF Pavilion. octoScope president Fanny Mlinarsky will also speak on Over-The-Air (OTA) test methods and metrics.
Demonstration
Tuesday-Thursday, August 2 to 4, 2011
National Instruments RF Pavilion
TS5101 Over-the-Air Test Methods and Metrics Technical Session
10:30-11:30 a.m. Wednesday, August 3, 2011
Modern smart phones with cellular, 3G/4G, Wi-Fi, Bluetooth and GPS radios cry out for OTA test methods due to their sheer number of connections. This session will review OTA test methods and metrics being developed for 3GPP and CTIA and discuss practical approaches to fast and accurate OTA-based production testing.
Austin Convention Center
Austin, TX
For more information about octoScope or to schedule an appointment and demonstration, please visit or contact .
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Press contact:
Georgia Marszalek
ValleyPR LLC for octoScope
+1-650-345-7477
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