BOSTON, MA — (Marketwire) — 11/27/12 — MRS Fall — Xradia, Inc., the world-s leading manufacturer of high resolution 3D X-ray microscopes, announced its new Scout-and-Scan Control Software for VersaXRM instruments. The new, easy-to-use control system is ideal in a multi-user setting where users have a wide variety of experience. The new control system maintains the flexibility for which the system is known, making set-up of scans even easier.
The intuitive workflow environment enables users to easily scout their region of interest and select scanning parameters. The new software also offers recipe-based repeatability, which is especially useful for , and also enables greater control and efficiency for future work. Additionally, a window in the control panel always provides a clear view of the sample being imaged. The new control system was especially created for the multi-user environment, from the of academia hosting professors and senior researchers through students of various levels, or the semiconductor failure analysis lab that serves a wide range of experience factors.
Howard Marks, Director of Silicon Technology Failure Analysis at NVIDIA, praised the speediness of the new control system: “With the old software, it took me more than 30 minutes to set up and create a recipe. With the new Scout-and-Scan control system, I can do it in 15 minutes or less. For our team, this translates to more efficient use of the system, making it even easier to get relevant results in a timely manner for our failure analysis work with the VersaXRM.”
Scout-and-Scan offers super simple steps for set-up:
Enter Details
and Center the Sample
for Region of Interest
Set-up the Parameters
Scout-and-Scan is offered as a free upgrade to existing VersaXRM customers under warranty or service contract, and will be provided during customers- next regularly scheduled product maintenance visit. The new software will be available in the first quarter of 2013.
Xradia designs and manufactures microscopes for industrial and academic research applications. Xradia-s solutions offer unparalleled high contrast and high resolution imaging capabilities for a large range of sample sizes and shapes. The company-s heritage began in the synchrotron and extends to the laboratory. Xradia-s laboratory product families, the UltraXRM-L and VersaXRM, together offer a multi-length scale solution delivering full volume 3D imaging with resolution down to 50 nm. Additional information can be found at .
Xradia, VersaXRM and Scout-and-Scan are trademarks of Xradia Inc. Other trademarks that may be mentioned in this release are the intellectual property of their respective owners.
Brenda Ropoulos
Public Relations
Xradia Inc.
+1-510-414-6772
FAX: 925.730-4952
E-mail:
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